Simulation device and method for simulation

ABSTRACT

A simulation device for simulating a peripheral circuit arrangement that can be connected to a control device, wherein the simulation device can be electrically connected to the control device, and the simulation device has a first control element for influencing a first simulation current that can be passed from a first load terminal of the control device to a first control element output of the first control element. The first control element contains a first multistage converter that includes a first converter output, which is electrically connected to a terminal on the converter side of a first inductive component at whose terminal on the control device side the first control element output is implemented. A direction of flow of the first simulation current is reversible, and the simulation device also includes a computing unit for execution of model code.

This nonprovisional application claims priority under 35 U.S.C. §119(a)to German Patent Application No. 10 2016 100 771.4, which was filed inGermany on Jan. 19, 2016, German Patent Application No. 10 2016 108933.8, which was filed in Germany on May 13, 2016, and European PatentApplication No. 16171914.1, which was filed in Europe on May 30, 2016,and which are herein incorporated by reference.

BACKGROUND OF THE INVENTION

Field of the Invention

The invention relates to a simulation device for simulating a peripheralcircuit arrangement that can be connected to a control device and amethod for simulating a peripheral circuit arrangement that can beconnected to a control device.

Description of the Background Art

A circuit for emulating—which is to say for simulating—an electricalload at a terminal of a test circuit is known from the WO 2010 010022A1, which corresponds to U.S. Pat. No. 8,754,663, and which isincorporated herein by reference. Some elements of FIG. 3 of theaforementioned PCT document are appended to the present document as FIG.1c for better understanding of the prior art. Said document proposes, inparticular, a controllable voltage source as a four-quadrant switchingdevice 17 with an internal voltage source 18. A current flowing from thefour-quadrant switching device 17 to the test circuit 3 can be coupledin, more particularly via inductance 14 of a bridge shunt arm.

Depending on the requirements for the dynamics of the circuit forsimulation, and depending on the nature of the requirements for avoidingor at least reducing an unwanted superposition of ripple currents on thecurrent in the bridge shunt arm or superposition of an unwanted—possiblyhigh-frequency—AC current on the current in the bridge shunt arm,conventional controllable voltage sources could prove to be inadequatefor highly precise simulation applications.

It is a part of general technical knowledge that a multi-phase, inparticular three-phase electrical load, for example an electric motor110 from FIG. 1a , implemented here as a three-phase electric motor, canbe connected to a supply circuit, wherein one associated half-bridgecircuit for each phase, for instance, can be connected to the relevantphase for current control. FIG. 1a shows an example from the prior art,in which the three phases 101, 102, 103 of an electric motor 110 aresupplied by means of a first half-bridge 104, 105, a second half-bridge106, 107, and a third half-bridge 108, 109, wherein these threehalf-bridges are composed of field-effect transistors 104, 105, 106,107, 108, 109, abbreviated as FETs. The drain terminals of the FETs 104,106, 108 are connected to a common operating voltage 111. The sourceterminals of the FETs 105, 107, 109 are connected to a common referencevoltage GND. The three half-bridges from FIG. 1a are integrated into,for instance, a control device that drives the electric motor 110.

FIG. 1b differs to FIG. 1a in that the electric motor 110 is replaced byan electric motor simulation device 120. It is an approach generallyknown from the prior art to replace a peripheral circuit arrangement,for example the electric motor 110 from FIG. 1a , with a simulationdevice, for example an electric motor simulation device 120 from FIG. 1b, for test purposes. A problem frequently encountered with prior artelectric motor simulation devices is that they either do not adequatelyemulate reality, or the prior art electric motor simulation devicescannot be retrofitted with sufficient flexibility to changed electricmotors that are to be simulated, or else such retrofits require veryextensive hardware changes that are time-consuming.

An appropriate test environment, for example, a simulation device, isfrequently used for testing of a control unit or a control device thatis to be connected to a peripheral circuit arrangement, for example anelectrical load, perhaps an electric motor, in an intended laterapplication.

It is known that an expert active in the technical field mentioned atthe outset who wishes to provide a simulation device for simulating aperipheral circuit arrangement that can be connected to a control deviceoftentimes makes use of a simulation device that includes a computingunit on which executable model code is installed. The model code isbased on a mathematical model of the peripheral circuit arrangement. Themathematical model is transformed into model code that can be executedon a computing unit, for instance in a method comprising multiple steps,for example including programming, so-called code generation, and atranslation step.

By means of cyclic execution, which is to say cyclic processing, of themodel code, predefined output variables are cyclically computed as afunction of input variables; these output variables can be used orprocessed further, for example, to provide voltages and/or currents forsimulation purposes.

Testing with the use of a simulation device can in particular offer theadvantage that the control unit or the control device can befunctionally tested without the need for the control unit or the controldevice to be placed in its “actual” operating environment. In theabove-described context, the control device under test, often referredto as the “control unit” under test, is frequently referred to as the“device under test,” abbreviated as “DUT.” Frequently, the controldevice or DUT is connected electrically to a suitably configuredsimulation device in order to test whether the control device respondsin the desired manner, which is to say whether the control deviceresponds to specific state variables received through its interfaceswith an appropriate output of output variables that are output throughits interfaces. The relevant environment of a control device is fully orpartially simulated for this purpose.

In generally recognized test scenarios, the environment to be emulatedof the control device under test also includes power electroniccomponents, in particular. For example, testing of a control device maymake it necessary to provide an emulation, which is to say a simulation,of an electric motor or another electrical load, which also includes, inparticular, an inductance simulation. In general, environments of thistype can be simulated in software as well as by means of hardware.Frequently, a simulation device, specially designed hardware, andspecially adapted simulation software are employed for testing of acontrol device with power electronic outputs and/or inputs.

Remaining with this example of a simulated electrical load, adistinctive feature of the simulation of an inductive load resides, inparticular, in that it is necessary to take into account in thesimulation that a change in the magnetic flux density passing throughthe corresponding actual inductive load, such as can be caused by aswitching operation in the control device, results in an inducedvoltage. The accompanying nonlinear current and voltage curves should beemulated as realistically as possible in the simulation of theelectrical load. In other words, the simulation device used in the testphase of the control device should reflect as closely as possible thebehavior of an “actual” inductive load that occurs in the later phase ofactual practice.

The simulation devices heretofore available, in particular thesimulation devices suitable for so-called “hardware-in-the-loopsimulation,” abbreviated “HIL simulation,” are lacking in adequatescalability and adaptability, which is to say that the scaling andadapting of previous simulation devices, for the purpose of, e.g.,adaptation of the simulation device to different inductive loads to besimulated, requires extensive hardware changes in many cases.Frequently, it has only been possible heretofore to solve the problemsresulting from the described inadequate scalability and inadequateadaptability through rebuilding or retrofitting work on the simulationdevice, especially when the electrotechnical parameters of the inductiveloads to be successively simulated differ greatly from one another.

There is a need in the industry and in research and development,especially in product development and quality assurance, for an improvedsimulation device for simulating a peripheral circuit arrangement, forexample for simulating an inductive load.

The simulation of the dynamic behavior of the inductive load by means ofmodel code is often subject to requirements such that the modelvariables that belong to the model code and are to be computedcyclically must, for example, be computable in execution times in therange of a few milliseconds or even only a few microseconds. In thiscontext, an execution time means the period of time that a computingunit requires in order to process a simulation model code once. In otherwords, the model code is cyclically executed during a simulation,wherein preferably each processing of the model code takes place withina predefined execution time, and the processing of the model code isessentially repeated for as long as the simulation runs. A model-basedsimulation such as takes place on the said simulation device presupposesa cyclic—which is to say a repeatedly executable—processing of the modelcode on the computing unit of the simulation device. Generally speaking,a use of computer-assisted simulation models and a use of associatedexecutable model codes is known, with which the aforementioned executiontimes for cyclic model code processing can be ensured, namely simulationmodels, for example, that can be created by means of a numericaldevelopment and simulation environment. One example of a development andsimulation environment including a graphical programming environment isthe software product SIMULINK from the firm The MathWorks. One exampleof the generation of executable model code, for example by means of thesoftware product SIMULINK, is mentioned in the U.S. Pat. No. 9,020,798B2, which is incorporated herein by reference.

However, in practice it frequently is not sufficient to merely providethe model variables for describing the dynamically changing state of theinductive load within the predefined execution time by means of themodel code; rather, it may be necessary, for example, to carry out thesimulation of the peripheral circuit arrangement, for example thesimulation of the inductive load, in such a manner that particularlyvoltages and/or currents are provided at the electrical connectionpoints between the simulation device and the control device(s) that havea high degree of agreement with the dynamically changing voltages and/orcurrents in an “actual”, which is to say not simulated, peripheralcircuit arrangement. The non-simulated peripheral circuit arrangementincludes an inductive load, for example.

In other words, it is a requirement to provide the user of thesimulation device with a device that is equipped to provide, at thedesignated electrical terminals of the simulation device, appropriatecurrents and/or voltages for the control device that in each caseexhibit only predefined maximum permissible deviations from thecorresponding currents and/or voltages of a later application of thecontrol device.

SUMMARY OF THE INVENTION

It is therefore an object of the invention to provide a simulationdevice and a method for simulating a peripheral circuit arrangement thatcan be connected to a control device, which advance the state of theart. The stated problems or disadvantages of the prior art shouldpreferably be at least partially avoided or reduced.

According to an exemplary embodiment of the invention, a simulationdevice for simulating a peripheral circuit arrangement that can beconnected to a control device is proposed, wherein the simulation deviceis electrically connected or can be electrically connected to thecontrol device, and the simulation device has a first control elementfor influencing a first simulation current that can be passed from afirst load terminal of the control device to a first control elementoutput of the first control element, and wherein the first controlelement contains a first multistage converter, and wherein the firstmultistage converter includes a first converter output, wherein thefirst converter output is provided and equipped to be electricallyconnected to a terminal on the converter side of a first inductivecomponent at whose terminal on the control device side the first controlelement output is implemented, and wherein the direction of flow of thefirst simulation current is reversible, and the simulation device alsoincludes a computing unit for execution of model code, wherein by meansof the model code that is stored and executable on the computing unit, afirst switch control signal can be provided for forwarding to a firstsemiconductor switch control, and wherein the first semiconductor switchcontrol is provided and equipped to convert the first switch controlsignal into at least a first modified switch control signal and to applyat least the first modified switch control signal to the firstmultistage converter.

Also proposed in accordance with the invention is a method forsimulating a peripheral circuit arrangement that can be connected to acontrol device, wherein a simulation device is electrically connected orcan be electrically connected to the control device, and wherein thesimulation device has a first control element with which a firstsimulation current that can be passed from a first load terminal of thecontrol device to a first control element output of the first controlelement is influenced, and wherein the first control element contains afirst multistage converter, and wherein the first multistage converterincludes a first converter output, wherein, connected to the firstconverter output, is a first inductive component at whose terminal onthe control device side the first control element output is implemented,and wherein the direction of flow of the first simulation current isreversed by voltage change at the first control element output, and thesimulation device also includes a computing unit that executes modelcode, wherein by means of the model code executed on the computing unit,a first switch control signal is provided for forwarding to a firstsemiconductor switch control, and wherein the first semiconductor switchcontrol converts the first switch control signal into at least a firstmodified switch control signal, and at least the first modified switchcontrol signal is applied to the first multistage converter, wherein afirst output voltage influenced by the model code is provided at thefirst control element output connected to the first multistageconverter.

It should be noted that a peripheral circuit arrangement can beunderstood within the scope of the invention to mean any desiredelectrical load that can be attached to a control device, for example anelectric motor or other electromechanical actuator.

One of the advantages of the invention, namely an improved, which is tosay more realistic simulation, frequently becomes evident inapplications where the peripheral circuit arrangement to be simulated isnot “only” an ohmic resistance, because the simulation device accordingto the invention primarily serves the purpose of providing nonlinearcurrent and voltage curves with changing current directions, for examplein order to thus simulate a current from a control device to an “actual”motor winding or another complex peripheral circuit arrangement—but onethat is not connected to the control device during the simulation. Themore realistic the simulation of the electrical behavior of theperipheral circuit arrangement is, the more meaningful the test resultsare that are produced in an interaction of the simulation device withthe connected control device being tested. Illustrated using the exampleof the first simulation current, this means that the more the firstsimulation current matches a current in the subsequent “actual”operating mode that flows from the control device to the “actual”peripheral circuit arrangement, which is to say to the “actual” motorwinding, for example, the better the controller characteristics of thecontrol device can be tested, and consequently optimized after the testor between multiple tests.

The model code can be a computer program that is executable on thecomputing unit, wherein it is essentially immaterial whether the modelcode is first translated in the course of execution, for example bymeans of an interpreter, or whether the model code is already present ina format that is executable by the computing unit without furthertranslation. The computing unit preferably includes a computing unitmicroprocessor or a computing unit microcontroller or an IP core,integrated on an FPGA, for example. One of the tasks of the computingunit associated with the simulation device is the generation of thefirst switch control signal by means of the executable model code,something that is discussed in greater detail below.

The first load terminal of the control device is an electrical interfacethat is implemented by the control device. An electrical load that isconnected to the first load terminal is supplied with a current throughthe first load terminal, wherein this current flows either in thedirection of the control device or in the direction of the loadconnected to the control device, depending on what time-varyingelectrical potential gradient has arisen between the first load terminaland the first control element output of the simulation device. The firstsimulation current is the electric current that flows either from thefirst load terminal of the control device to the first control elementoutput of the simulation device or from the first control element outputof the simulation device to the first load terminal of the controldevice.

The electrical load, also referred to herein as a peripheral circuitarrangement, can be replaced for test purposes by a simulated peripheralcircuit arrangement, namely the simulation device.

The first control element includes a first multistage converter, whichpreferably has at least a first, a second, a third, a fourthsemiconductor switch for influencing the first simulation current. It isadditionally preferred that, during a running simulation, acorresponding signal originating from the first semiconductor switchcontrol is applied to each of the last-mentioned four semiconductorswitches via the control terminal of the applicable semiconductorswitch, which process is discussed in greater detail below. The firstmultistage converter has a first converter output through which at leasta part of the first simulation current flows.

The first control element output according to the present teaching is aninterface of the simulation device, wherein this interface represents aconnection established via the first inductive component to the firstconverter output of the first multistage converter. The first outputvoltage of the first control element, which is influenced by the modelcode executed on the computing unit, is present at the first controlelement output. When a connection is established from the first controlelement output to the first load terminal of the control device, asimulation current influenced by the model code flows through thisconnection in a direction influenced by the model code.

Preferably the first control element includes at least foursemiconductor switches, each of which is placed in a conductive or anon-conductive state by way of a corresponding first modified switchcontrol signal of the first semiconductor switch control, wherein aspecially designed time behavior of the conductive and non-conductivestates is brought about for each of the four semiconductor switches ofthe first control element. In other words, the time behaviors of theswitching states of the four semiconductor switches of the first controlelement are different.

The first multistage converter provided in accordance with theinvention, which is a component of the first control element, hassemiconductor switches, wherein the semiconductor switches preferablyare implemented as field-effect transistors, often abbreviated as“FETs,” for example so-called power field-effect transistors, or asso-called silicon carbide JFET components, abbreviated as SiC-JFETs, oras bipolar transistors, or as so-called IGBT components, i.e., bipolartransistors with insulated gate electrodes (IGBT is derived from theterm “insulated-gate bipolar transistor”).

The first multistage converter preferably is equipped to provide anoutput voltage at its first converter output whose maximum value is lessthan or equal to the value of a third supply voltage, and whose minimumvalue is greater than or equal to the value of a first supply voltage,and the output voltage additionally can assume a value that correspondsto a second supply voltage, where the following quantity relationsapply: the third supply voltage is greater than the second supplyvoltage, and the second supply voltage is greater than the first supplyvoltage. The first supply voltage, the second supply voltage, and thethird supply voltage provide power to the first control element and thusto the first multistage converter.

If the first multistage converter, according to a preferred embodimentof the first control element, includes four semiconductor switches, thenprovision is made that a voltage that is between the third supplyvoltage and the first supply voltage can be established at the firstconverter output through timed control of the four semiconductorswitches of the first control element. For the purposes of providing arequired voltage at the first converter output, at least one firstmodified switch control signal that is based on the calculation usingthe model code must be applied to the control terminals of the firstcontrol element during a running simulation of the peripheral circuitarrangement.

During a running simulation of the peripheral circuit arrangement, it ispreferred for the first modified switch control signal to beelectrically applied to four control terminals of the first controlelement. The first modified switch control signal preferably includesfour gate-source voltages, which preferably have different voltagevalues. In other words, it is preferred that each gate-source voltage ofthe four gate-source voltages is electrically applied to one of thepreferably four control terminals of the first control element.

In an embodiment of the simulation device, provision is made thatadditional predefined data originating from the control device are madeavailable by the control device to the computing unit of the simulationdevice in parallel with the cyclic execution of the model code, andthese data are provided in order to be taken into account in the cyclicexecution of the model code. In other words, the last-mentionedembodiment of the simulation device is equipped to use data from thecontrol device as input variables in the calculations of the model code.A suitable interface of the control device for providing dataoriginating from the control device for the purpose of forwarding it tothe computing unit of the simulation device is, on the control deviceside, a so-called debug interface, for example a standardized JTAG orNexus interface.

An embodiment of the simulation device according to the invention has,in addition to the first control element, a second control element and athird control element.

In the last-mentioned improvement of the invention, provision is madethat the second control element is implemented as a second multistageconverter and/or the third control element is implemented as a thirdmultistage converter. The phrase “additional multistage converters” inthe text below conceptually combines at least the second multistageconverter and the third multistage converter, but this is not intendedto convey, however, that a simulation device that has two or four ormore than four multistage converters cannot be a useful improvement ofthe invention. The additional multistage converters preferably areconnected to the first supply voltage, to the second supply voltage, andto the third supply voltage.

In addition, it is preferred that the additional multistage converters,for example the second multistage converter of the second controlelement and the multistage converter of the third control element, havea hardware structure that is essentially the same as or that isidentical to that of the first multistage converter of the first controlelement.

It is proposed within the scope of the present teaching to preferablyimplement the first multistage converter and/or the additionalmultistage converters as three-stage converters in each case. Athree-stage converter is distinguished by the fact that three differentinput potentials or input voltages are present at the three-stageconverter in ongoing operation, wherein, through appropriate driving ofthe semiconductor switches of the three-stage converter, an outputvoltage can be established that in principle—if line and transmissionlosses are disregarded—extends from the smallest input voltage throughthe medium input voltage to the largest input voltage of the applicablethree-stage converter. The three-stage converter, which represents apreferred embodiment of the multistage converter, is discussed againbelow within the framework of the figure description. Generallyspeaking, it is possible not only to implement the first and/or theadditional multistage converters as three-stage converters, which is tosay with three different supply voltages, but it is alternatively alsopossible for the multistage converter or converters to be implemented asfour-stage converters or as N-stage converters, which is to say withfour or N different supply voltages, for example with N=4, N=5, N=6, orN>6.

The inductive component provided in accordance with the inventivesimulation device is preferably implemented as an electrical coil. It isoptionally possible to provide for the electrical coil to be equippedwith a ferrite core or an iron core. In addition, an electricalcomponent for changing the inductance value of the inductive componentcan be provided in that the electrical component brings about, e.g., adisplacement of a ferrite or iron core interacting with the coil.

It should be noted that an inductive reactance of the inductivecomponent can have a non-negligible limiting effect on the firstsimulation current during a transition of one of the four semiconductorswitches of the first multistage converter, for example, whereinpreferably the model code and/or a control apparatus of the simulationdevice is designed to take into account and/or to compensate for thelimiting effect. The fact that a limiting or increase of the simulationcurrent during a running simulation is not of necessity caused solely bythe simulation device is further clarified using the following figuresand the figure description. The simulation device is thereforepreferably equipped to take into account a potential gradient betweenone voltage at the first converter output and another voltage at thefirst control element output, in particular, which is achieved in animprovement of the invention through processing of the informationconcerning the first output voltage of the first control element duringcyclic processing of the model code by the computing unit.

According to the present invention the simulation device includes, amongother things, a computing unit for execution of model code.Fundamentally, any desired computer can be used as the computing unit aslong as it is ensured that the computer has at least a minimum computingpower matched to the relevant application, and suitable equipment, forexample adequate working memory, wherein the computing power and theequipment of the computing unit must also suffice to ensure cyclicexecution of the model code within a predefined cycle time. Preferably,the computing unit is real-time capable, wherein it is preferred inparticular for the computing unit to be equipped with a so-calledreal-time operating system. It is especially preferred for both thereal-time operating system and the model code to be implemented suchthat all necessary criteria of what is known as “hard real-time” are metduring execution of the model code by the computing unit. In the contextdescribed, hard real-time means that, for example, the cyclic executionof the model code is guaranteed to take place within a predefined timeinterval, namely a predefined maximum cycle time. In the last-mentionedembodiment of the computing unit, which is hard real-time-capable,exceeding the predefined maximum cycle time, if the exceedance were tooccur once, results in a system fault of the computing unit, whichcauses, e.g., an abnormal termination or a restart of the simulation.

The computing unit has at least one output for outputting the firstswitch control signal and optionally for outputting a second and/orthird switch control signal.

The first switch control signal is provided by the computing unit forforwarding to a first semiconductor switch control during ongoingoperation of the simulation device. The first semiconductor switchcontrol is provided and equipped to convert the first switch controlsignal into at least a first modified switch control signal.

During ongoing operation of the simulation device, the first switchcontrol signal is converted into at least a first modified switchcontrol signal, which is to say that a signal conversion takes placewithin the first semiconductor switch control from the initiallyabstract first switch control signal to the first modified switchcontrol signal that is intended for direct transmission to the controlterminals of the semiconductor switches of the first control element.

Even though the first switch control signal already contains informationabout a desired switch state of at least one semiconductor switch of thefirst control element, the first switch control signal is not intendedto be applied directly to one or more control terminals of thesemiconductor switches of the first control element, because the firstswitch control signal is first converted into a first modified switchcontrol signal having appropriately matched signal levels for control ofthe semiconductor switches of the first control element. In other words,this means that the information provided by the executed model codeabout a state of the first control element that is to be established iscontained in the first switch control signal. The first semiconductorswitch control is provided and equipped to convert the first switchcontrol signal into a first modified switch control signal. Preferably,the modified switch control signal is applied directly to the controlterminals of the first control element in order to achieve the switchstate to be established in the first control element that is computed bythe model code in each computation cycle. The first modified switchcontrol signal is matched to the technical parameters of thesemiconductor switches to be controlled, for example to theirsemiconductor switch gate-source voltage interval that is permissible orspecified by a semiconductor switch manufacturer, wherein the example ofthe matched gate-source voltage interval applies in particular to thosesemiconductor switches that are implemented as field-effect transistors.

For the purpose of easier understanding of the present teaching,field-effect transistors are frequently cited hereinafter as embodimentsof the semiconductor switches of the first control element and/or of thesecond control element and/or of the third control element, although asa general rule other embodiments of semiconductor switches, for examplethe “IGBT components” already mentioned, can also be used. A personskilled in the art, insofar as he has knowledge of the presentinvention, will easily choose suitable semiconductor switches, forexample suitable FETs, for the control element or control elements ofthe simulation device while taking into account the electricalrequirements for the simulation device.

Where a field-effect transistor is mentioned in the text below as anexemplary embodiment of a semiconductor switch of the first controlelement, of the second control element, and/or of the third controlelement, a signal controlling the applicable field-effect transistor ofthe first control element that includes the first modified controlsignal is referred to as a “gate-source voltage” of the field-effecttransistor that is controlled thereby.

Preferably, the first modified switch control signal includes fourgate-source voltages for driving preferably four control terminals ofthe first control element, wherein each gate-source voltage of the fourgate-source voltages is associated with one corresponding controlterminal of the first control element. In the preferred embodiment ofthe first control element, in which the first control element includesat least four semiconductor switches, it is preferred that each of thefour gate-source voltages controlled through the model code is connectedin each case to one of the four semiconductor switches, thus in theexample is connected to one of the four field-effect transistors of thefirst control element.

Preferably, provision is made that by applying the first modified switchcontrol signal, which has four gate-source voltages, to the field-effecttransistors of the first multistage converter of the first controlelement, a first dynamically variable simulation current is established,which in particular is influenced by the computation results of themodel code executed on the computing unit.

Further scope of applicability of the present invention will becomeapparent from the detailed description given hereinafter. However, itshould be understood that the detailed description and specificexamples, while indicating preferred embodiments of the invention, aregiven by way of illustration only, since various changes andmodifications within the spirit and scope of the invention will becomeapparent to those skilled in the art from this detailed description.

BRIEF DESCRIPTION OF THE DRAWINGS

The present invention will become more fully understood from thedetailed description given hereinbelow and the accompanying drawingswhich are given by way of illustration only, and thus, are not limitiveof the present invention, and wherein:

FIG. 1a is a schematic view of a circuit arrangement known from theprior art for driving a three-phase electric motor 110, wherein eachhalf-bridge of a total of three half-bridges is connected to one phaseterminal of the electric motor;

FIG. 1b is a schematic view of a circuit arrangement known from theprior art having firstly three half-bridges such as are contained inknown control devices, and secondly an electric motor simulation device120;

FIG. 1c is a circuit for emulating or simulating an electrical load at aterminal of a test circuit, as is already known from the document WO2010 010022 A1;

FIG. 2 is a schematic view of an embodiment of a simulation deviceaccording to the invention; and

FIG. 3 is a schematic view of an embodiment of a simulation deviceaccording to the invention.

DETAILED DESCRIPTION

FIGS. 1a, 1b, and 1c have already been covered within the framework ofthe introduction to the description in the discussion of the prior art.For this reason, further explanation of FIGS. 1a, 1b, 1c can bedispensed with in the text that follows.

The illustration in FIG. 2 shows a view of a first embodiment of asimulation device Hx and a control device DUT electrically connected tothe simulation device Hx.

The first control element S1 shown schematically in FIG. 2 includes atleast four semiconductor switches, namely a first semiconductor switchT11 of the first control element S1, a second semiconductor switch T12of the first control element S1, a third semiconductor switch T13 of thefirst control element S1, and a fourth semiconductor switch T14 of thefirst control element S1.

The last-mentioned four semiconductor switches T11, T12, T13, T14 arewired to one another and to a first supply voltage U1 or a second supplyvoltage U2 or a third supply voltage U3 such that the first controlelement S1 has a first multistage converter.

In especially preferred fashion, the at least four semiconductorswitches of the first control element S1 are implemented as FETs. It ispreferred here that these four semiconductor switches are connected toone another or to the first supply voltage U1 or the second supplyvoltage U2 or the third supply voltage U3 in the manner described asfollows: The drain terminal of the first semiconductor switch T11 isconnected to the third supply voltage U3; the source terminal of thefirst semiconductor switch T11 is connected to the drain terminal of thesecond semiconductor switch T12; the source terminal of the secondsemiconductor switch T12 and the drain terminal of the thirdsemiconductor switch T13 and the terminal on the converter side of thefirst inductive component L1 are connected to one another; the sourceterminal of the third semiconductor switch T13 is connected to the drainterminal of the fourth semiconductor switch T14; the source terminal ofthe fourth semiconductor switch T14 is connected to the first supplyvoltage U1.

The control terminals G11, G12, G13, G14 of the first control element S1are connected to corresponding outputs of a first semiconductor switchcontrol Tc1.

The first control element S1 shown schematically in FIG. 2 additionallyincludes a first diode D11 and a second diode D12. The cathode of thefirst diode D11 is connected to the source terminal of the firstsemiconductor switch T11 and to the drain terminal of the secondsemiconductor switch T12. The anode of the first diode D11 can beconnected to or is connected to the second supply voltage U2. Duringongoing operation of the simulation device Hx, the second supply voltageU2 is present at the anode of the first diode D11. The anode of thesecond diode D12 is connected to the source terminal of the thirdsemiconductor switch T13 and to the drain terminal of the fourthsemiconductor switch T14. The cathode of the second diode D12 can beconnected to or is connected to the second supply voltage. Duringongoing operation of the simulation device Hx, the second supply voltageU2 is present at the cathode of the second diode D12.

In accordance with FIG. 2, the first control element S1 associated hasbeen deleted in an otherwise identical paragraph in the document withRef. No. 13-009-01-EP] includes the first semiconductor switch T11, thesecond semiconductor switch T12, the third semiconductor switch T13, andthe fourth semiconductor switch 14, wherein preferably each of thesefour semiconductor switches is a so-called FET, which is to say afield-effect transistor. Normally, a so-called bulk terminal and thesource terminal of the same FET are electrically connected. A so-called“body diode,” which is also referred to as a “reverse diode,” one ofwhich is inherently present in each of the FETs, is shown in the drawingbut without a reference symbol. As is shown in FIG. 2, in each of thesefour semiconductor switches T11, T12, T13, T14, one cathode of anassociated body diode is electrically connected to an associated drainterminal, and one anode of an associated body diode is electricallyconnected to an associated source terminal. Because the body diodes arenot material to the invention, they are not described in greater detail.

The first supply voltage U1, the second supply voltage U2, the thirdsupply voltage U3, and a first output voltage Uout1 are each referencedto a first reference voltage GND1.

According to an embodiment, the second supply voltage U2 is equal to thefirst reference voltage GND1, wherein the third supply voltage U3 has apositive voltage value and the first supply voltage has a negativevoltage value.

During the course of a signal conversion of the first switch controlsignal Ts1 by the first semiconductor switch control Tc1, the firstmodified switch control signal Ts11, Ts12, Ts13, Ts14 is produced. Inaccordance with the embodiment shown in FIG. 2 of the simulation deviceHx with four semiconductor switches T11, T12, T13, T14 implemented asfield-effect transistors, provision preferably is made that the firstmodified switch control signal has at least four gate-source voltagesthat are intended to be applied to preferably four control terminalsG11, G12, G13, G14 of the first control element.

Each of the last-mentioned four gate-source voltages preferably is setwith the first semiconductor switch control Tc1 as a function of thefirst switch control signal Ts1 such that a desired electrical potentialarises at the first converter output M1. A potential gradient betweenthe first load terminal D1 of the control device DUT and the firstconverter output M1 of the first control element S1 created by theelectrical potential established at the first converter output M1necessarily results in a first simulation current Is1 along thepotential gradient.

Specifically, the last-mentioned four gate-source voltages include: afirst gate-source voltage Ts11 of the first modified switch controlsignal controlling the first semiconductor switch T11; a secondgate-source voltage Ts12 of the first modified switch control signalcontrolling the second semiconductor switch T12; a third gate-sourcevoltage Ts13 of the first modified switch control signal controlling thethird semiconductor switch T13; and a fourth gate-source voltage Ts14 ofthe first modified switch control signal controlling the fourthsemiconductor switch T14.

For example, a preferably digitally coded first switch control signalTs1 is generated cyclically as a function of a computation result of thecyclically processed model code, and from this is subsequently generateda corresponding cyclically variable first modified switch control signalthat has four associated cyclically variable gate-source voltages of thefirst modified switch control signal Ts11, Ts12, Ts13, Ts14. By means ofthe four gate-source voltages of the first modified switch controlsignal Ts11, Ts12, Ts13, Ts14, one or more of the semiconductor switchesT11, T12, T13, T14 of the first control element is or are, for example,brought from a blocking state to a conductive state or vice versa for atime computed by model code in order to thus set the first simulationcurrent Is1 based on the computation result of the model code.

It is preferred for the computing unit Cx to have an input (not shown inthe drawing) for reading in a measured value of the first output voltageUout1 and/or a measured value of the first simulation current Is1. Ifthe computing unit has a corresponding input for reading in the measuredfirst output voltage Uout1 or for reading in the measured firstsimulation current Is1, provision preferably is made that the computingunit Cx makes a change in the first switch control signal Ts1 as afunction of the first output voltage Uout1 or as a function of the firstsimulation current Is1 by means of the model code and taking intoaccount the measured first output voltage Uout1 or taking into accountthe measured first simulation current Is1.

The exemplary embodiment of the simulation device Hx according to theinvention disclosed in accordance with FIG. 3 shows, in addition to thefirst control element S1, a second control element S2 and a thirdcontrol element S3. The simulation device Hx from FIG. 3 thus has atotal of three control elements S1, S2, S3, which are essentiallyidentical with respect to their structure in terms of hardware.

Preferably the semiconductor switches shown of the first control elementS1, of the second control element S2, and of the third control elementS3 are implemented as field-effect transistors, abbreviated as FETs.

In addition, it is preferred to supply the three control elements S1,S2, S3 shown in FIG. 3 of the simulation device Hx with the first supplyvoltage U1, the second supply voltage U2, and the third supply voltageU3.

In the exemplary embodiment in accordance with FIG. 3, the third supplyvoltage U3 is connected to the drain terminals of the firstsemiconductor switch T11 of the first control element S1, of the firstsemiconductor switch T21 of the second control element S2, and/or of thefirst semiconductor switch T31 of the third control element S3.

In the exemplary embodiment in accordance with FIG. 3, the second supplyvoltage U2 is connected via diode/s in the exemplary embodiment in FIG.3 to the source terminals of the first semiconductor switch T11 of thefirst control element S1 via diode D11, of the first semiconductorswitch T21 of the second control element S2 via diode D21, of the firstsemiconductor switch T31 of the third control element S3 via diode D31,wherein the anodes of the diodes D11, D21, and D31 are connected to thesecond supply voltage U2, of the third semiconductor switch T13 of thefirst control element S1 via diode D12, of the third semiconductorswitch T23 of the second control element S2 via diode D22, of the thirdsemiconductor switch T33 of the third control element S3 via diode D32,wherein the cathodes of the diodes D12, D22, and D32 are connected tothe second supply voltage U2.

The second supply voltage U2 in the exemplary embodiment in accordancewith FIG. 3 is connected via diode/s to the drain terminals of thesecond semiconductor switch T12 of the first control element S1 viadiode D11, of the second semiconductor switch T22 of the second controlelement S2 via diode D21, of the second semiconductor switch T32 of thethird control element S3 via diode D31, of the fourth semiconductorswitch T14 of the first control element S1 via diode D12, of the fourthsemiconductor switch T24 of the second control element S2 via diode D22,and of the fourth semiconductor switch T34 of the third control elementS3 via diode D32.

The first supply voltage U1 is connected to the source terminals of thefourth semiconductor switch T14 of the first control element S1, of thefourth semiconductor switch T24 of the second control element S2, and ofthe fourth semiconductor switch T34 of the third control element S3.

In the exemplary embodiments in accordance with FIGS. 2 and 3, the firstconverter output M1 associated with the first control element S1, whichis electrically connected to a terminal on the converter side of a firstinductive component L1, also forms an electrical connection point to thesource terminal of the second semiconductor switch T12 of the firstcontrol element S1 and the drain terminal of the third semiconductorswitch T13 of the first control element S1.

In the exemplary embodiment in accordance with FIG. 3, a secondconverter output M2 associated with the second control element S2, whichis electrically connected to a terminal on the converter side of asecond inductive component L2, also forms an electrical connection pointto the source terminal of the second semiconductor switch T22 of thesecond control element S2 and the drain terminal of the thirdsemiconductor switch T23 of the second control element S2.

In the exemplary embodiment in accordance with FIG. 3, a third converteroutput M3 associated with the third control element S3, which iselectrically connected to a terminal on the converter side of a thirdinductive component L3, also forms an electrical connection point to thesource terminal of the second semiconductor switch T32 of the thirdcontrol element S3 and the drain terminal of the third semiconductorswitch T33 of the third control element S3.

The computing unit Cx of the embodiment of the simulation device Hx inaccordance with FIG. 3 provides the first switch control signal Ts1, thesecond switch control signal Ts2, and the third switch control signalTs3 by means of the model code cyclically executed on the computing unitCx in every cycle of the model code execution.

In the embodiment in accordance with FIG. 3, as in the embodiment inaccordance with FIG. 2, the first switch control signal Ts1 is convertedby the first semiconductor switch control Tc1 into the first modifiedswitch control signal Ts11, Ts12, Ts13, Ts14. In a similar manner, it isshown in FIG. 3 that nonspecific—with respect to a form of asemiconductor switch—switch control signals, namely the first switchcontrol signal Ts1, the second switch control signal Ts2, and the thirdswitch control signal Ts3, are converted into semiconductorswitch-specific, which is to say modified, switch control signals, forexample gate-source voltages for FETs, which are proposed as preferredsemiconductor switches of the first control element S1, of the secondcontrol element S2, and/or of the third control element S3.

In one embodiment of the invention in accordance with FIG. 3, the firstmultistage converter of the first control element S1 and the secondmultistage converter of the second control element S2 and the thirdmultistage converter of the third control element S3 are constructedusing FETs, and consequently the control terminals of the first controlelement S1, of the second control element S2, and of the third controlelement S3 are implemented as gate terminals of the FETs.

It is demonstrated as part of the present figure description, inparticular with the use of the embodiments of the simulation device Hxaccording to the invention shown in FIGS. 2 and 3, that after aconversion of the first switch control signal Ts1 by the firstsemiconductor switch control Tc1 into the first modified switch controlsignal Ts11, Ts12, Ts13, Ts14; preferably after a conversion of a secondswitch control signal Ts2 by the second semiconductor switch control Tc2into a second modified switch control signal Ts21, Ts22, Ts23, Ts24;preferably after a conversion of a third switch control signal Ts3 bythe third semiconductor switch control Tc3 into a third modified switchcontrol signal Ts31, Ts32, Ts33, Ts34, an application of the firstmodified switch control signal Ts11, Ts12, Ts13, Ts14 to the firstcontrol element S1; preferably, an application of the second modifiedswitch control signal Ts21, Ts22, Ts23, Ts24 to the second controlelement S2; or preferably, an application of the third modified switchcontrol signal Ts31, Ts32, Ts33, Ts34 to the third control element S3takes or take place.

If, for example, the semiconductor switches of the first control elementS1 are implemented as FETs, as schematically shown in FIG. 2 and in FIG.3, then preferably gate-source voltages of the first control element S1are arranged as follows: A first control terminal G11 has acorresponding first gate-source voltage Ts11 applied to it, a secondcontrol terminal G12 has a corresponding second gate-source voltage Ts12applied to it, a third control terminal G13 has a corresponding thirdgate-source voltage Ts13 applied to it, and a fourth control terminalG14 has a corresponding fourth gate-source voltage Ts14 applied to it,wherein the last-mentioned four gate-source voltages preferably areincluded in the first modified switch control signal Ts11, Ts12, Ts13,Ts14.

In the embodiment in accordance with FIG. 3, the second switch controlsignal Ts2 is converted by the second semiconductor switch control Tc2into a second modified switch control signal Ts21, Ts22, Ts23, Ts24,which has a semiconductor-switch-specific gate-source voltage for eachof the four semiconductor switches T21, T22, T23, T24 shown of thesecond control element S2.

If, for example, the semiconductor switches of the second controlelement S2 are implemented as FETs, as schematically shown in FIG. 3,then preferably gate-source voltages of the second control element S2are arranged as follows: a fifth control terminal G21 has acorresponding fifth gate-source voltage Ts21 applied to it, a sixthcontrol terminal G22 has a corresponding sixth gate-source voltage Ts22applied to it, a seventh control terminal G23 has a correspondingseventh gate-source voltage Ts23 applied to it, and an eighth controlterminal G24 has a corresponding eighth gate-source voltage Ts24 appliedto it, wherein the last-mentioned four gate-source voltages preferablyare included in the second modified switch control signal Ts21, Ts22,Ts23, Ts24.

In the embodiment in accordance with FIG. 3, the third switch controlsignal Ts3 is converted by the third semiconductor switch control Tc3into a third modified switch control signal Ts21, Ts22, Ts23, Ts24,which has a semiconductor-switch-specific gate-source voltage for eachof the four semiconductor switches T31, T32, T33, T34 shown of the thirdcontrol element S3.

If, for example, the semiconductor switches of the third control elementS3 are implemented as FETs, as schematically shown in FIG. 3, thenpreferably gate-source voltages of the third control element S3 arearranged as follows: a ninth control terminal G31 has a correspondingninth gate-source voltage Ts31 applied to it, a tenth control terminalG32 has a corresponding tenth gate-source voltage Ts32 applied to it, aneleventh control terminal G33 has a corresponding eleventh gate-sourcevoltage Ts33 applied to it, and a twelfth control terminal G34 has acorresponding twelfth gate-source voltage Ts34 applied to it, whereinthe last-mentioned four gate-source voltages preferably are included inthe third modified switch control signal Ts31, Ts32, Ts33, Ts34.

In an exemplary embodiment of the simulation device Hx in accordancewith FIG. 3 it is preferred that the first control element output Out1,which is formed by the terminal on the control device side of the firstinductive component L1, and the second control element output Out2,which is formed by the terminal on the control device side of the secondinductive component L2, and the third control element output Out3, whichis formed by the terminal on the control device side of the thirdinductive component L3.

Moreover, in the exemplary embodiment in accordance with FIG. 3 it ispreferred that the first control element output Out1 and the secondcontrol element output Out2 and the third control element output Out3are electrically connected to one another by an electrical jumper, andthe electrical jumper is provided and equipped to be connected to thefirst load terminal D1 of the control device DUT.

The additional advantage resulting from the circuit arrangement inaccordance with FIG. 3 resides in that the currents flowing through thefirst load terminal D1 can be emulated especially precisely by means ofthe simulation device Hx.

In the exemplary embodiment in accordance with FIG. 3 a first capacitorC1 and a second capacitor C2 preferably are connected to the threelast-mentioned supply voltages U1, U2, U3 for smoothing of the firstsupply voltage U1 and of the third supply voltage U3, and specificallyas follows: A first electrode of the first capacitor C1 is connected tothe first supply voltage U1, and a second electrode of the firstcapacitor C1 is connected to the second supply voltage U2, and a firstelectrode of the second capacitor C2 is connected to the second supplyvoltage U2, and a second electrode of the second capacitor C2 isconnected to the third supply voltage U3.

In an embodiment of the simulation device Hx according to the invention,provision is made that the first multistage converter has at least afirst, a second, a third, a fourth semiconductor switch T11, T12, T13,T14, wherein the first, the second, the third, the fourth semiconductorswitch T11, T12, T13, T14 includes, in each case, at least one controlterminal G11, G12, G13, G14, and wherein a first output voltage Uout1influenced by the model code can be provided at the first controlelement output Out1 connected to the first multistage converter. It isan advantage of the last-mentioned embodiment that, by means of thefirst multistage converter, to whose four semiconductor switches T11,T12, T13, T14 the first modified switch control signal Ts11, Ts12, Ts13,Ts14 is applied, can be achieved cost-effectively and, moreover, highlydynamically variable current changes of the first simulation current Is1calculated by the model code can be provided.

In accordance with another improvement of the simulation device Hxaccording to the invention, said device additionally has a secondcontrol element S2 and a third control element S3, wherein the secondcontrol element S2 is implemented as a second multistage converterand/or wherein the third control element S3 is implemented as a thirdmultistage converter.

In the last-mentioned improvement of the simulation device Hx, thesecond control element S2 and the third control element S3advantageously stand ready, along with the first control element S1, toimplement an addition of output current of the first control element S1plus output current of the second control element S2 plus output currentof the third control element S3 by means of an electrical connection ofthe first control element output Out1, the second control element outputOut2, and the third control element output Out3, wherein the totalcurrent resulting from the addition can be delivered to a first loadterminal D1 of the control device DUT, such as is provided, for example,by means of a preferred simulation device Hx in accordance with FIG. 3.This total current is, as a general rule, more dynamically variable thana first simulation current Is1 that, for example, is delivered to afirst load terminal D1 in accordance with FIG. 2 by a single firstcontrol element S1, which is to say without any addition to anotheroutput current from another control element.

The more dynamically a simulation current Is1 that is deliverable to thefirst load terminal D1 of the control device DUT can be varied by meansof the simulation device Hx, the more realistically the simulationdevice Hx will be able to simulate, for test purposes, currents thatwill flow through the first load terminal D1 of the control device DUTin a later “actual” use.

In an embodiment of the simulation device Hx according to the invention,the first multistage converter and/or the second multistage converterand/or the third multistage converter is or are implemented asthree-stage converters. Surprisingly, an especially advantageouscost-benefit ratio is established for a simulation device Hx when atleast the second multistage converter, which is included in the secondcontrol element S2, and optionally also the third multistage converter,which is included in the third control element S3, is or are implementedas three-stage converters. In particular, the highly dynamic nature ofthe last-mentioned total current achievable by means of the three-stageconverter enters into the evaluation of the benefit here.

An embodiment of the simulation device Hx is especially preferred inwhich the second control element S2 is implemented as a secondthree-stage converter having a second group of at least foursemiconductor switches T21, T22, T23, T24 and a second control elementoutput Out2, and wherein the third control element S3 is implemented asa third three-stage converter having a third group of at least foursemiconductor switches T31, T32, T33, T34 and a third control elementoutput Out3, and the first control element output Out1 and the secondcontrol element output Out2 and the third control element output Out3are electrically connected to one another.

In an embodiment of the simulation device Hx, during a cyclic executionof the model code on the computing unit Cx, provision is made for themodel code at predefined time intervals to process a state messageprovided by the control device DUT, containing information that reflectsan upcoming or completed state change of a first driver transistor Td1of the control device DUT or an upcoming or completed state change of asecond driver transistor Td2 of the control device DUT, in order toinfluence at least the first control element S1. This last-mentionedimprovement of the simulation device Hx advantageously opens up anoption to influence at least a first control element S1 either earlieror based on an enlarged database.

In an embodiment of the last-mentioned improvement of the simulationdevice Hx, a generation of the state message is provided at eachmeasurement time of a measurement of the first output voltage Uout1,and/or the state message is placed in a causal relationship with ameasured value of the measurement of the first output voltage Uout1 atthe measurement time of the associated measurement of the first outputvoltage Uout1

Additionally, in a further embodiment of the simulation device Hx,provision can be made that in one of the two last-mentioned embodimentsof the simulation device Hx, the state message can be provided atpredefined time intervals by a control device microprocessor (not shownin the drawing) associated with the control device DUT by means ofcontrol code that can be executed on the control device microprocessor.The last-mentioned embodiment permits especially early adaptation of theswitching state of the simulation device Hx to a variable firstsimulation current Is1, because the information about the state changesof the first driver transistor Td1 and of the second driver transistorTd2 of the control device DUT normally is first present in a controldevice microprocessor associated with the control device, since thecontrol code is executed by means of the control device microprocessorin the control device DUT. Preferably, the control of the first drivertransistor Td1 and of the second driver transistor Td2 takes place as afunction of the computation result of the executed control code, inparticular.

Preferably, the state message transmitted from the control device DUT tothe simulation device Hx is further processed in the computing unit Cxof the simulation device Hx in order to exert a controlling influence onthe switching states of the semiconductor switches T11, T12, T13, T14associated with the first control element S1.

In another embodiment of the simulation device Hx according to theinvention, the first control element S1 includes at least a first supplyvoltage terminal having a first supply voltage U1 and a second supplyvoltage terminal having a second supply voltage U2, and a third supplyvoltage terminal having a third supply voltage U3, wherein the thirdsupply voltage U3 is greater than the second supply voltage U2, which isgreater than the first supply voltage U1, wherein the first outputvoltage Uout1 can be set between the third supply voltage U3 and thefirst supply voltage U1 by an application of the first switch controlsignal Ts1 to the control terminals G11, G12, G13, G14 of the firstcontrol element S1, and wherein the first output voltage Uout1 isreferenced to a first reference voltage GND1.

In accordance with an additional embodiment of the simulation device Hxaccording to the invention, an auxiliary signal connection (not shown inthe drawing) is established or can be established from the computingunit Cx of the simulation device Hx to a control device microprocessorincluded in the control device DUT in order to influence the firstand/or the second and/or the third switch control signal Ts1, Ts2, Ts3as a function of information transmitted from the control devicemicroprocessor to the computing unit Cx via auxiliary signal connection.The auxiliary signal connection reduces the load with respect to anavailable bandwidth of an optionally provided additional signalconnection that is provided or can be provided for the purpose of dataexchange between the control device DUT and the simulation device Hx.Both the auxiliary signal connection and the additional signalconnection are optionally implemented as bidirectional data connections.Both the auxiliary signal connection and the additional signalconnection can have electrical connecting lines, optical cables, and/ora radio connection, for example WLAN, as connecting media.

If the first control element S1 has at least a first supply voltageterminal having a first supply voltage U1 and a second supply voltageterminal having a second supply voltage U2 and a third supply voltageterminal having a third supply voltage U3, provision is made in anespecially preferred embodiment of the simulation device Hx that, withinthe first control element S1, with reference to a first referencevoltage GND1, the third supply voltage U3 has a positive voltage value,and the first supply voltage U1 has a negative voltage value, andfurthermore the following quantity relations apply: the second supplyvoltage U2 is identical to the first reference voltage GND1, which is tosay U2=GND1; the second supply voltage U2 has an identical voltagedifference in terms of magnitude both to the third supply voltage U3 andto the first supply voltage U1, which is to say |U3−U2|=|U2−U1|; thesecond reference voltage GND2 is greater than the first supply voltageU1 and less than the second supply voltage U2, which is to sayU1<GND2<U2; a fourth supply voltage Ub1 is greater than the secondsupply voltage U2 and less than the third supply voltage U3, which is tosay U2<Ub1<U3; the difference formed from the fourth supply voltage Ub1as minuend and the second supply voltage U2 as subtrahend is identicalto the difference formed from the second supply voltage U2 as minuendand the second reference voltage GND2 as subtrahend, which is to sayUb1−U2=U2−GND2.

The last-mentioned embodiment can be used to advantage for an especiallylarge number of simulation scenarios having practical relevance.Surprisingly, because of the symmetry in the last-mentioned embodimentand described in the equations |U3−U2|=|U2−U1| and |Ub1−U2=U2−GND2| italso turns out that model code with a less complex structure is neededfor the simulation device Hx to simulate the peripheral circuitarrangement than would have been the case without the symmetry describedwith the last-mentioned equation. In one embodiment an electrochemicalenergy storage device, for example a storage battery, can be provided inorder to provide the fourth supply voltage Ub1.

The method according to the invention for simulating a peripheralcircuit arrangement that can be connected to a control device DUT isbased on a simulation device Hx that is electrically connected or can beelectrically connected to the control device DUT, wherein the simulationdevice Hx has a first control element S1 with which a first simulationcurrent Is1 that can be passed from a first load terminal D1 of thecontrol device DUT to a first control element output Out1 of the firstcontrol element S1 is influenced. The first control element S1 containsa first multistage converter, wherein the first multistage converterincludes a first converter output M1, wherein, connected to the firstconverter output M1, is a first inductive component L1 at whose terminalon the control device side the first control element output Out1 isimplemented. The direction of flow of the first simulation current Is1is reversed by voltage change at the first control element output Out1.The simulation device Hx also includes a computing unit Cx that executesmodel code, wherein by means of the model code executed on the computingunit Cx, a first switch control signal Ts1 is provided for forwarding toa first semiconductor switch control Tc1. The first semiconductor switchcontrol Tc1 converts the first switch control signal Ts1 into at least afirst modified switch control signal Ts11, Ts12, Ts13, Ts14, and atleast the first modified switch control signal Ts11, Ts12, Ts13, Ts14 isapplied to the first multistage converter. A first output voltage Uout1influenced by the model code is provided at the first control elementoutput Out1 connected to the first multistage converter.

Using embodiments of the simulation device Hx according to theinvention, FIG. 2 and FIG. 3 show components preferably involved in themethod that have an operative connection with regard to the method.

A particular advantage of the method according to the invention is thatthe first multistage converter of the first control element S1influences the first simulation current Is1 through the firstsemiconductor switch control Tc1 with an especially short delay once acorresponding request for changing the first simulation current Is1 hasbeen calculated by means of the model code on the computing unit Cx,whereupon a corresponding first switch control signal Ts1 is output bythe computing unit Cx to the first semiconductor switch control Tc1.Achieving a desired change in the first simulation current Is1 with theleast possible delay by means of the simulation device Hx isadvantageous because the behavior of numerous peripheral circuitarrangements, which can include, e.g., inductive loads, can thus beemulated in a sufficiently precise manner. It is also advantageous thatthe method according to the invention can be executed using a simulationdevice Hx that can be achieved relatively cost-effectively and modelcode that is relatively uncomplicated in design, and hencecost-effective.

In a preferred improvement of the method according to the invention, themethod is executed on a simulation device Hx according to one of claims1 to 9. The advantages of the last-mentioned improvement are improvedresults of the simulation, in particular based on a reduced delay in anachievement of a change of the first simulation current Is1 and/or achange of the first output voltage Uout1 of the first control elementS1.

In another improvement of the method, the model code is executedcyclically a number Nx times at fixed time intervals, which is to say attime intervals that are constant over time, by means of the computingunit Cx, and within each of the Nx fixed time intervals, each of thefirst switch control signal Ts1 for forwarding to the firstsemiconductor switch control Tc1 and/or the second switch control signalTs2 for forwarding to the second semiconductor switch control Tc2 and/orthe third switch control signal Ts3 for forwarding to the thirdsemiconductor switch control Tc3 is or are calculated.

An advantage of the cyclic execution of the model code and the cycliccalculation of the first and/or second and/or third switch controlsignal(s) is that the simulation device Hx preferably responds in eachcycle to a current change and/or voltage change on at least oneinterface of the control device DUT.

The cycle times in which the first switch control signal Ts1, the secondswitch control signal Ts2, and/or the third switch control signal Ts3is/are calculated by means of the model code preferably are a fewmilliseconds or preferably even lie in the range of a few microseconds.A trend in the field of HIL simulations mentioned at the outset is to nolonger compute the executable model code solely by means ofmicroprocessors, but instead increasingly to displace time-criticalparts of the model code and time-critical executable sub-models to FPGAcomponents or similar hardware components with programmable logic, bywhich even cycle times of less than one microsecond are achievable forthe part of the model code running on the FPGA.

In accordance with another embodiment of the method according to theinvention, the first switch control signal Ts1 is calculated by means ofthe model code as a function of a measured current value of the firstsimulation current Is1 and/or a measured voltage value of the firstoutput voltage Uout1.

A particular advantage of the last-mentioned embodiment is that noexchange of digital data between the control device DUT and thesimulation device Hx needs to take place in order to simulate theperipheral circuit arrangement, because the last-mentioned measuredcurrent value or the last-mentioned measured voltage value in thisembodiment preferably includes sufficient information about theswitching states of the first driver transistor Td1 and/or the seconddriver transistor Td2 for computation of the model code.

In another embodiment of the method starting from an Nth computationcycle of the model code, a measured current value of the firstsimulation current Is1 and/or a measured voltage value of the firstoutput voltage Uout1 is or are measured in the Nth computation cycle,and in an (N+1)th computation cycle, the measured current value and/orthe measured voltage value enter into the computation of the firstswitch control signal Ts1 by means of the model code in order to reducea deviation of the measured current value of the first simulationcurrent Is1 and/or in order to reduce a deviation of the measuredvoltage value of the first output voltage Uout1 from a correspondingideal value conforming with the model code, wherein the (N+1)thcomputation cycle is the computation cycle that directly follows the Nthcomputation cycle.

A further advantage that results from the last-mentioned embodiment ofthe method is that a maximum time offset equal to one computation cycletime occurs between a determination of an actual value with regard tothe simulation current Is1 and/or with regard to the first outputvoltage Uout1 on the one hand, and a corresponding computation of acorrection by means of the model code with regard to the simulationcurrent Is1 and/or with regard to the first output voltage Uout1 on theother hand, which leads to an improvement in the simulation results.

In a preferred use of the simulation device (Hx) according to theinvention, the device is employed as a so-called “hardware-in-the-loopsimulation device,” also referred to by technical experts as an HILsimulator. The computation of the model variables by means of the modelcode preferably takes place in real time in this case.

In summary, the advantages of the simulation device according to theinvention and the method according to the invention includes that animproved, in particular more realistic, simulation of a peripheralcircuit arrangement that can be connected to a control device is madepossible. The disadvantages of the prior art stated at the outset are atleast partially lessened or avoided by means of the simulation deviceaccording to the invention and by means of the method according to theinvention.

The invention being thus described, it will be obvious that the same maybe varied in many ways. Such variations are not to be regarded as adeparture from the spirit and scope of the invention, and all suchmodifications as would be obvious to one skilled in the art are to beincluded within the scope of the following claims.

What is claimed is:
 1. A simulation device for simulating a peripheralcircuit arrangement connectable to a control device, wherein thesimulation device is electrically connectable to the control device, thesimulation device comprising: a first control element adapted toinfluence a first simulation current that is passable from a first loadterminal of the control device to a first control element output of thefirst control element, the first control element having a firstmultistage converter, the first multistage converter having a firstconverter output adapted to be electrically connected to a terminal on aconverter side of a first inductive component at whose terminal on thecontrol device side the first control element output is implemented,wherein a direction of flow of the first simulation current beingreversible; and a computing unit adapted to execute a model code,wherein, via the model code that is stored and executable on thecomputing unit, a first switch control signal is provided for forwardingto a first semiconductor switch control, and wherein the firstsemiconductor switch control is adapted to convert the first switchcontrol signal into at least a first modified switch control signal andto apply at least the first modified switch control signal to the firstmultistage converter.
 2. The simulation device according to claim 1,wherein the first multistage converter has at least a first, a second, athird, and a fourth semiconductor switch, wherein the first, the second,the third, the fourth semiconductor switch include at least one controlterminal, and wherein a first output voltage influenced by the modelcode is provided at the first control element output connected to thefirst multistage converter.
 3. The simulation device according to claim1, wherein the simulation device also has a second control element and athird control element, and wherein the second control element isimplemented as a second multistage converter and/or wherein the thirdcontrol element is implemented as a third multistage converter.
 4. Thesimulation device according to claim 3, wherein the first multistageconverter and/or the second multistage converter and/or the thirdmultistage converter are three-stage converters.
 5. The simulationdevice according to claim 3, wherein the second control element is asecond three-stage converter having a second group of at least foursemiconductor switches and a second control element output, wherein thethird control element is a third three-stage converter having a thirdgroup of at least four semiconductor switches and a third controlelement output, and wherein the first control element output and thesecond control element output and the third control element output areelectrically connected to one another.
 6. The simulation deviceaccording to claim 1, wherein, during a cyclic execution of the modelcode on the computing unit, the model code at predefined time intervalsis adapted to process a state message provided by the control devicecontaining information that reflects an upcoming or completed statechange of a first driver transistor of the control device or an upcomingor completed state change of a second driver transistor of the controldevice to influence at least the first control element.
 7. Thesimulation device according to claim 6, wherein a generation of thestate message is provided at each measurement time of a measurement ofthe first output voltage and/or the state message is placed in a causalrelationship with a measured value of the measurement of the firstoutput voltage at the measurement time of the associated measurement ofthe first output voltage.
 8. The simulation device according to claim 6,wherein the state message is adapted to be provided at predefined timeintervals by a control device microprocessor associated with the controldevice via control code executable on the control device microprocessor.9. The simulation device according to claim 1, wherein the first controlelement comprises: a first supply voltage terminal having a first supplyvoltage; a second supply voltage terminal having a second supplyvoltage; and a third supply voltage terminal having a third supplyvoltage, wherein the third supply voltage is greater than the secondsupply voltage, wherein the second supply voltage is greater than thefirst supply voltage, wherein the first output voltage is adapted to beset between the third supply voltage and the first supply voltage by anapplication of the first switch control signal to the control terminalsof the first control element, and wherein the first output voltage isreferenced to a first reference voltage.
 10. The simulation deviceaccording to claim 1, wherein an auxiliary signal connection is adaptedto be established from the computing unit of the simulation device to acontrol device microprocessor included in the control device toinfluence the first and/or the second and/or the third switch controlsignal as a function of information transmitted from the control devicemicroprocessor to the computing unit via auxiliary signal connection.11. The simulation device according to claim 9, wherein, within thefirst control element, with reference to the first reference voltage,the third supply voltage has a positive voltage value, and the firstsupply voltage has a negative voltage value, and wherein the followingquantity relations apply: the second supply voltage is identical to thefirst reference voltage; the second supply voltage has an identicalvoltage difference in terms of magnitude both to the third supplyvoltage and to the first supply voltage; the second reference voltage isgreater than the first supply voltage and less than the second supplyvoltage; the fourth supply voltage is greater than the second supplyvoltage and less than the third supply voltage; and a difference formedfrom the fourth supply voltage as minuend and the second supply voltageas subtrahend is identical to the difference formed from the secondsupply voltage as minuend and the second reference voltage assubtrahend.
 12. A method for simulating a peripheral circuit arrangementadapted to be connected to a control device, the method comprising:providing a simulation device that is adapted to be electricallyconnected to the control device, the simulation device having a firstcontrol element with which a first simulation current that is passedfrom a first load terminal of the control device to a first controlelement output of the first control element is influenced; providing thefirst control element with a first multistage converter, the firstmultistage converter having a first converter output; connecting to thefirst converter output, a first inductive component at whose terminal ona control device side the first control element output is provided;reversing a direction of flow of the first simulation current via avoltage change at the first control element output; executing a modelcode via a computing unit, wherein, via the model code executed on thecomputing unit, a first switch control signal is provided for forwardingto a first semiconductor switch control; converting, via the firstsemiconductor switch control, a first switch control signal into atleast a first modified switch control signal; applying the at least thefirst modified switch control signal to the first multistage converter;and influencing a first output voltage by the model code, the firstoutput voltage being provided at the first control element outputconnected to the first multistage converter.
 13. The method according toclaim 12, wherein the method is executed on a simulation device.
 14. Themethod according to claim 12, wherein the model code is executedcyclically a number Nx times at fixed time intervals by the computingunit, and within each of the Nx fixed time intervals: the first switchcontrol signal for forwarding to the first semiconductor switch controlis calculated; and/or the second switch control signal for forwarding tothe second semiconductor switch control is calculated; and/or the thirdswitch control signal for forwarding to the third semiconductor switchcontrol is calculated.
 15. The method according to claim 12, wherein thefirst switch control signal is calculated by the model code as afunction of a measured current value of the first simulation currentand/or a measured voltage value of the first output voltage.
 16. Themethod according to claim 12, wherein, starting from an Nth computationcycle of the model code, a measured current value of the firstsimulation current and/or a measured voltage value of the first outputvoltage is measured in the Nth computation cycle, wherein, in an (N+1)thcomputation cycle, the measured current value and/or the measuredvoltage value is entered into the computation of the first switchcontrol signal by the model code in order to reduce a deviation of themeasured current value of the first simulation current and/or in orderto reduce a deviation of the measured voltage value of the first outputvoltage from a corresponding ideal value conforming with the model code,and wherein the (N+1)th computation cycle is the computation cycle thatdirectly follows the Nth computation cycle.